Wilfried Sauer; Martin Oppermann; Gerald Weigert; Sebastian Werner; Heinz Wohlrabe; Klaus-Jürgen Wolter; Thomas Zerna Springer London Ltd (2006) Kovakantinen kirja
Jürgen Kehrer; Carsten Sebastian Henn; Sandra Lüpkes; Tatjana Kruse; Ralf Kramp; Sabine Trinkaus; Peter Godazgar; Heinric KBV Verlags-und Medienges (2016) Pehmeäkantinen kirja
Wilfried Sauer; Martin Oppermann; Gerald Weigert; Sebastian Werner; Heinz Wohlrabe; Klaus-Jürgen Wolter; Thomas Zerna Springer London Ltd (2010) Pehmeäkantinen kirja
Hans-Georg Weigand; Andreas Filler; Reinhard Holzl; Sebastian Kuntze; Matthias Ludwig; Jurgen Roth; Barbar Schmidt-Thieme Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (2013) Pehmeäkantinen kirja
Peter Bastian; Monika Burgmaier; Walter Eichler; Thomas Käppel; Werner Klee; Karsten Kober; Jürgen Schwarz; Klaus Tkotz Europa Lehrmittel Verlag (2013) CDR-levy
Peter Bastian; Monika Burgmaier; Walter Eichler; Thomas Käppel; Werner Klee; Karsten Kober; Jürgen Schwarz; Klaus Tkotz Europa Lehrmittel Verlag (2015) CDR-levy
Springer London Ltd Sivumäärä: 482 sivua Asu: Kovakantinen kirja Painos: and ed. Julkaisuvuosi: 2006, 20.07.2006 (lisätietoa) Kieli: Englanti
In electronics manufacture, the expanding range of products and the smaller-and-smaller scale of increasingly integrated components is producing a trend towards complex and fault-susceptible processes. This fact, coupled with shorter production times and the importance of quality assurance necessitates that process technology be more adaptable and open to new procedures than ever before.
"Electronics Process Technology" is a systemised presentation of new techniques and methods in electronics manufacture. Planning, preparation and execution are interlinked to achieve robust manufacturing processes that realise optimum quality, costs and quantities in the final product.
Topics covered include:
- modelling of manufacturing processes;
- graph-theoretical approach to manufacturing planning;
- process simulation and optimisation including cost optimisation;
- quality assurance and statistical process analysis and control;